Bobrovnyk S. Investigation of Moire and Pendullosung fringes in monocrystals under influence of external forces.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0400U001466

Thesis Registration Form

0400U001466.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

14-04-2000

Specialized Academic Board

Д76.051.01

Essay

Propeties of thickness oscillations of X-Ray scattering intensity in weak and strong distorted Si, Ge monocrystals under influence of external force were found out. The influence of focused force in plane-parallel case was researched. The influence of dislocations and microdefects on integral parameter values of chips structural perfection is discussed. Diffusion and koherent components contibutions is reseached.

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