Kucheyev S. Electrooptic effects in MOS - liquid crystal structures due to transferring and storage of charge

Electrooptic effects in MOS-liquid crystal structures. To determine the connection between charge processes and electrooptic effects induced by these processes. Methods of investigation are lectrooptical, volt-amper and volt-contrast characteristics. It has been found that charge accumulation and adsorption near a pore of dielectric film induce the instability of homeotrop and planar oriented nematic. It is shown that accumulation of charge induces the transition from the oblique to the homeotrop state of nematic in hybrid cell. It is shown that the accumulation of charge in liquid crystal cause the depletion of silicon surface and induce local domains. The results are used in R&D Institute of microdevices, Kiev. Field of application includes a liquid crystal physics, nondestructive testing of electronic products