Lasyuchenko O. Tensosensibility effect in film Cu, Cr and Sc based structures

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0401U002133

Thesis Registration Form

0401U002133.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

03-07-2001

Specialized Academic Board

К 55.051.02

Essay

Development of tensosensibility model of single- and multilayer film system with deformation effect account; determine method of parameters of electrons scattering for free mean electron path, surface, grain boundary scattering coefficients proposed; receiving of experimental size for temperature coefficient of resistance and tensosensibility coefficients of Cu, Cr and Sc films and multiplayer films Cu, Cr and Sc based; method of vacuum evaporation, diffraction of electron, electron microscopy and secondary ion mass - spectrometry.

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