Glushchak S. Method and means of test diagnosis of digital and microprocessor devices with the components constructed on CMOS-technology

Object of research - process of test diagnosis of digital and microprocessor devices with the components constructed on CMOS-technology; the purpose of researches - development of test combined diagnosis by development of new model, method and means of revealing of dynamic malfunctions of digital and microprocessor devices with the components constructed on CMOS-technology; method of testing and instrumentation - technic diagnostics of computers, sets theory, mathematical logic, computer; idealized and practical outcomes - model of digital and microprocessor devices with the components constructed on CMOS-technology, as unit under test, new models of dynamic malfunctions of digital and microprocessor devices with the components constructed on CMOS-technology, model of means of revealing of dynamic malfunctions of digital and microprocessor devices with the components constructed on CMOS-technology, method of revealing of dynamic malfunctions of digital and microprocessor devices with the components constructed on CMOS-technology, soft hardware of revealing of dynamic malfunctions of digital and microprocessor devices with the components constructed on CMOS-technology; the novelty - confirms by the publications, the novelty of outcomes which one is established by the experts and demonstrate matching with the confirming clones; a degree of an intrusion - within the limits of branch; an orb (branch) of an intrusion - computer production and using.