Steblenko L. Microplastic properties of near-surface layers of silicon crystals

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0404U002454

Thesis Registration Form

0404U002454.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

26-05-2004

Specialized Academic Board

Д 26.207.01

Institute for Problems in Materials Science

Essay

Based on experimental study of the influence of external factors on the physical properties of silicon crystals containing near-surface dislocations, a correlated behavior of the studied properties under action of external fields is established. Microscopic parameters of dislocation-impurity interaction in Si crystals with different impurity compositions are calculated and principal peculiarities of the electroplastic and magnetoplastic effects are investigated.

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Files

aref.doc

aref.tutyl.doc

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