Fedorova O. One-dimensional disordering of the layered structures of Bi-based metal-oxide compounds

The correlations between the characteristics of the XRD peaks and parameters of the stacking fault (SF) ensembles were found for crystals of Bi-Sr-Ca-Cu-O and Sr-Bi-Nb-O systems. The properties of XRD patterns were shown to be dependent on the type of SF, their concentrations and on the ratio between the unit-cell parameter c of the basic structure and the thickness of SF, l. Special pairs of the XRD peaks were revealed, for which the ratio between values their diffraction vectors is determined by the parameters of SF ensembles and independent on the c/l ratio value. On the basis of the obtained results, a method of the XRD pattern analysis was developed to examine the SF type, their concentration and pattern their distribution in the crystal. By means of the XRD technique, the structure characterization of the Bi-Sr-Ca-Cu-O single crystals and Sr-Bi-Nb-O epitaxial c-oriented films containing SF was performed.