Fedortsov D. Topography and diffractometry of silicon crystals with dislocations and microdefects under condition of X-ray acoustic resonance

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0404U004527

Thesis Registration Form

0404U004527.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

29-10-2004

Specialized Academic Board

Д 76.051.01

Essay

The topographic images of dislocation loops, barriers of the Lomer-Cottrell and their systems with microdefects were constructed using the numerical methods. Influence of the orientation characteristics of the dislocation loops on the space X-ray intensity distributions and on the rocking curves was determined. Influence of the strain fields of the dislocation loops on the X-ray acoustic interaction was investigated. The Debye-Waller factor L and factor of diffusive losses were estimated.

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Files

Avtoref-aref.doc

Avtoref-avtoref.doc

disertacia.doc

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