Reyda O. Information Measuring Systems of Structural Defects Removing of Scanned Image of Multilayer Photographic Materials

Research object - process of structural defects removing of scanned image of multilayer photographic materials (MPM); research target - design of methods to increase accuracy of detecting defects of MPM, and quality of restored objects; research methods and hardware - analytical and experimental; theoretical and practical results - method of MPM defects detection is offered and realized with the next parameters: standard deviation (StDev) is 3 micron and maximum deviation is 8 micron when scanned with resolution 8 micron, method of object restoring which exposed is offered and realized with the next parameters: StDev is 8 micron and maximum deviation is 18 micron when scanned with resolution 8 micron; level of implementation - in field area; field (area) of using - information systems for research photogrammetric materials.