Rudnitska I. Deformation dependences of the total integrated intensities in the diffractometry of defects of sigle crystals

The new model of the deformation dependence have been proposed, in particular, the elastic bend (EB) dependence of the total integrated refflective power (TIRP) of the single crystals with the distributed at random defects (DRD). This model takes in account both the extinction effects due to the scattering at the DRD in the coherent TIRP component, which is dependent on EB, and also for the first time established phenomenologically in paper the dependence on EB of the diffuse TIRP component and of the caused by scattering at defects integrated factors of extinction of the bragg and diffuse TIRP components. This for the first time allowed to give the adequate quantitative description of the experimentally observed effects of the joint influence of DRD and EB on TIRP. In particular, the observed anomalous effects are explained of the possible depending on the value of the extinction effects both additive (for small values), and nonadditive (for large values) influences of DRD and EB on TIRP. As a consequence the unique method have been developed for the quantitative diagnostics of the DRD including nanoscale characteristics on the basis of the TIRP deformation dependences investigation.