Protsenko S. The influence of temperature and deformation dependence of electrons transfer parameters on electrical and physical properties of multilayer film Cr, Cu and Sc (Co) based.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0405U001892

Thesis Registration Form

0405U001892.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

13-05-2005

Specialized Academic Board

Д 64.051.03

V.N. Karazin Kharkiv National University

Essay

Object of study: size, themperature and deformation effects in electrical and physical properties of multilayer films. Aim: to establish features of electrical and physical properties of multilayer films Cr, Cu and Sc (Co) based. Methods: transmission electron and atomic-force microscopy (AFM), high-energy electron diffraction, AES, secondary-ion mass-spectrometry (SIMS). Results, novelty: semi-classic models of TCR and GF for double-layers films, which satisfactorily correspond to experimental results, were proposed. Semi-phenomenon models for multilayers systems with account temperature and deformation dependences of the coefficients of p, r and Q. Models has been tested for double- and triple- layers system, in which individual layers. Field of implementation: thin films physics.

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