Reshetnyk O. New principles of dynamical triple-crystal X-ray diffractometry of microdefects in real monocrystals

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0405U004831

Thesis Registration Form

0405U004831.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

13-12-2005

Specialized Academic Board

Д.26.168.02

Essay

The differential-integrated method has been created and realized in the case of Bragg diffraction which for the first time operates with integrated scattering intensities measured separately by triple-crystal diffractometer. The new physical models which are taking into account the influence of the real defect structure in all the crystals of X-ray optic schemes of triple-axis diffractometers on measured profiles of intensity distribution in the vicinity of reciprocal lattice points of the samples under investigation. One the base of developed new principles, the combined approach to the characterization of microdefects of several types has been realized by complex use of triple-crystal and high-resolution double-crystal diffractometers.

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