Gutsulyak B. Х-ray diffractometry and internal friction of structural changes in silicon crystals after irradiated by high-energy particles.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0406U000457

Thesis Registration Form

0406U000457.pdf

Applicant for

Gutsulyak Bogdan Ivanovich

Specialization

01.04.07 - Фізика твердого тіла

Date of defense

25-11-2005

Specialized Academic Board

Д 76.051.01

Essay

Carried out complex X-ray researches on irradiated and not irradiated silicon crystals. Defined the change of the concentration, size, and spectre of microdefects in silicon crystals in the conditions of continuous natural ageing (> 9 years). Examined the type influence and irradiation doze on the change of defect structure and structural homogeneity of crystal. Dissertation presents possible mechanisms of transformation of defect structure silicon.

Thesis supervisor

Fodchuk Igor Michylovych

Official opponents

Кладько Василь Петрович
Годованюк Василь Миколайович

Files

Disertazia.doc

aref.doc

Similar theses

0424U000065

Mazur Dmytro V.

X-ray absorption and magnetic circular dichroism spectra features in compounds containing oxygen and based on 4th period metals

0523U100214

Serhii V. Oliinyk

Physical basis of formation of electrical and photoelectric properties of AIIBVI crystals and electrical properties of multicomponent coatings

0522U100045

Bohdanov Yevhen Ivanovych

Effects of azimuthal asymmetry of radiation scattering in crystals and new possibilities of diffuse-dynamical diffractometry

0522U100002

Vladymyrskyi Igor A.

Thermally-induced structural phase transitions in heterogeneous systems based on magnetic and nonmagnetic nanolayers

0521U102118

Kornyushchenko Anna S.

Structure formation and physical properties of nearequilibrium metal, oxide and multicomponent condensates with nanoscale elements