Shumkov Y. The information-measuring system for researches of linear circuits with the concentrated parameters

Dissertation is devoted to the problem of productivity increase, range expansion, and the increase of exactness of the measuring of linear circuits' parameters and their components on the basis of methods using the testing signals (TS) of special form. The ground of application is given during the conducting of the researches of specially selected TS, built according to the system of exponents, at the synthesis of which the model of the explored circuits is taken into account. The new method of synthesis and forming of the selected class TS is developed on the basis of exponential spline models (ESM) for the measuring and control of linear circuits' parameters and their components. The mathematical spline models of TS, which correspond to the real signals in linear electric circuits, are obtained. The methodology and the structures of TS forming are developed and explored on the basis of synthesized ESM by digital-analog devices. The researches are conducted and the estimations of methodical and instrumental constituents of TS reproducing error on the basis of ESM are obtained. The researches are conducted and the estimations of measuring error of linear circuits' parameters and their components are got using TS, which are formed on the basis of ESM. The methods and recommendations are developed on the minimization of the indicated error on the stage of construction of TS spline model. The method of the minimization of measuring error of linear analog devices' transitional characteristics, which is caused by the imperfection of real stepped TS form in a nanosecond range, is developed and explored. The minimization is carried out by the correction of TS form, and by taking into account during the process of model measuring and estimation the imperfection of real formed TS according to the system of "point" parameters adoptable for direct experimental determination. The new structures of the facilities of measuring are developed with the improved metrology and technical characteristics.