Grayvoronskaya K. Processes of structure formation in fullerite C60 thin films and single crystals.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0408U004346

Thesis Registration Form

0408U004346.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

15-10-2008

Specialized Academic Board

Д 26.207.01

Institute for Problems in Materials Science

Essay

TEM study of C60 fullerite thin films of island-like structure that were obtained on various substrates was fulfilled with the purpose of investigating their growth mechanism. The systematic comparison was done of the results of experimental study of the defect structure of the C60 films and single crystals obtained by 'integral' methods (X-ray diffraction and electron diffraction study), and by 'local' method, i.e., high resolution electron microscopy (HREM).

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Files

dis_Grayvoronskaya-1.doc

dis_Grayvoronskaya-2.doc

dis_Grayvoronskaya-3.doc

dis_Grayvoronskaya-4.doc

dis_Grayvoronskaya-ВСТУП.doc

dis_Grayvoronskaya-Зміст.doc

dis_Grayvoronskaya-Література.doc

dis_Grayvoronskaya-НАЦІОНАЛЬНА АКАДЕМІЯ НАУК УКРАЇНИ.doc

Автореферат Грайворонская.doc

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