Seredenko R. The modified model of dynamical high-resolution X-ray diffractometry

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0408U004532

Thesis Registration Form

0408U004532.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

04-11-2008

Specialized Academic Board

Д 26.168.02

G. V. Kurdyumov IMPh of the N.A.S.U.

Essay

The modified dynamical model of the high-resolution X-ray diffractometry, which accounts for asymmetry of the diffuse scattering intensity from microdefects with a size spread, thermal diffuse scattering intensity, and also influence of a finite size of the detector acceptance aperture, and other instrumental factors, has been created

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Титульна+Зміст+вступ.doc

автореферат.doc

висновки.doc

література.doc

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