Fesiv I. Interference images of deformation fields caused by action of lumped forces

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0411U001280

Thesis Registration Form

0411U001280.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

16-12-2010

Specialized Academic Board

Д 76.051.01

Essay

The thesis is devoted to establishing the mechanisms and regularities of formation of interference X-ray images on sectional and moirе images of the deformation field's intensity distributions resulting from action of local and specifically distributed lumped forces of various magnitudes on a surface of crystalline silicon. Functional dependence of formation of new intensity oscillations at the output surface on the applied load magnitude has been determined. Theoretical calculations have been carried out for moirе patterns, as well as analysis of their changes for the case of action of different in magnitudes lumped local forces on the input and output analyzing crystal of an LLL-interferometer.

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Files

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