Vasylyk I. Diffractometry of Single Crystals with Albitrary Thicknesses of Disturbed Surface Layers and Microdefect Size

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0413U003686

Thesis Registration Form

0413U003686.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

04-06-2013

Specialized Academic Board

Д 26.168.02

G. V. Kurdyumov IMPh of the N.A.S.U.

Essay

Asymmetry effect of azimuthal dependence of normalized dynamical diffraction total integrated intensity was discovered. For the first time this effect allowed us to evaluate characteristics of technological damages in single-crystal layers without damaging them. The thickness of those can be commensurate with or greater than the extinction length. A model of multiparameter integrated diffractometry of damaged surface layers parameters in single crystals where also present are both homogeneously and possibly uniformly distributed defects of several types, with no restrictions on the defect sizes and layer thicknesses was validated, i.e. orientation dependence of interference absorption coefficient and the contribution of interference components of dynamical diffraction total integrated intensity of kinematical and dynamical scattering layers was taken into account.

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Files

aref_vasylyk.doc

diser_vasylyk.doc

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