Iermolenko I. Methods and Devices to Improve the Efficiency of Computer Systems for Measuring the Current-Voltage Characteristics of Semiconductor Devices

The object of research: the measurement process of current-voltage characteristics of semiconductor devices. The purpose of research: to improve the efficiency of computer systems for measuring the current-voltage characteristics of semiconductor devices by reducing their self-heating during the measurement, reducing the measurement duration and increase the automation degree of measurements. Methods of research: methods of mathematical analysis, computer simulation, the elements of the theory of algorithms; methods of mathematical modeling; theory of electrical and electronic circuits, analysis methods of linear and nonlinear circuits, methods of physical modeling, object oriented programming methodology. Theoretical and practical results and innovations: a new adaptive method for measuring the current-voltage characteristics is proposed, which comprises in the preliminary automatic determination of the transient time and thermal parameters of semiconductor device, and the subsequent formation of measuring pulse sequence with these parameters; the model and structural algorithmic organization of the computer system are developed to implement the adaptive method of measuring the current-voltage characteristics of semiconductor devices; the mathematical model describing the cooling process of semiconductor device during the pulse sequence is improved, that allows computer systems to measure the current-voltage characteristics considering the thermal properties of the investigated semiconductor device and also to reduce the duration of the measurement process; in order to improve the efficiency of measurements the recommendations for the formation of measurement pulse sequence are proposed; the algorithms of automatic determination of duration transients and thermal parameters of semiconductor device are proposed; the hardware schematic and software of the computer system for measuring the current-voltage characteristics are developed. A subject degree of introduction: are used in State Scientific and Production Enterprise “Photon” (Alchevsk), at the department of Specialized Computer Systems of Donbas State Technical University (Alchevsk). Effectiveness of implantation: the process of selection the transistors for high-power sources is simplified, the degree of automation is increased and the manufacture time of the devices are significantly reduced . Sphere of use: the semiconductor devices manufacturing process.