Muratov O. X-ray diffraction study of structure of Al–(TM)–Si (TM — Mn, Fe, Co and Ni) melts.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0415U005006

Applicant for

Specialization

  • 02.00.04 - Фізична хімія

30-06-2015

Specialized Academic Board

Д 26.001.03

Taras Shevchenko National University of Kyiv

Essay

The thesis is devoted to experimental investigation of structure of ternary Al–(TM)–Si (TM — Mn, Fe, Co, Ni) and boundary binary Al–Si, Al–Fe, Fe–Si, Ni–Si melts by means of X-ray diffraction experiments and RMC simulations. In addition MD-simulations of liquid Al and Si have been performed. The calculation of intensity curves (IC) of X-ray diffraction for the ternary melts has been also performed using corresponding curves of the boundary binary melts.

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