Andriienko V. Methods and means for monitoring and improving the reliability of storage devices in systems critical use

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0416U001148

Thesis Registration Form

0416U001148.pdf

Applicant for

Specialization

  • 05.11.13 - Прилади і методи контролю та визначення складу речовин

19-01-2016

Specialized Academic Board

Д 26.002.18

Publishing and Printing Institute of Igor Sikorsky Kyiv Polytechnic Institute

Essay

This allowed to identify the negative impact that implements the joint influence of external parameters (temperature, electrostatic fields, vibrations etc.). In the dissertation obtained depending on the influence of external factors on the functionality of semiconductor memory devices in the systems of critical use. This allows to determine the optimal modes of its operation. It is an established fact growth time of reliable operation at 100% leads to an increase in term limit operation 1.5-2.5 times. A linear increase of the surface density of microdefects decreases the life time limit up to 25%.

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Files

aref.doc

dis.doc

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