Kryvyi S. High resolution X-ray diagnostic of the influence of deformations on structure of nanosize systems

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0417U004621

Thesis Registration Form

0417U004621.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

15-11-2017

Specialized Academic Board

Д 26.199.01

V. Lashkaryov Institute of semiconductor physics

Essay

In the thesis, the results of complex investigation of the structural quality and deformation state of AlGaN/GaN superlattices, GeSn layers on Ge/Si (001) and nanoporous systems are presented. An analysis of the relaxation mechanisms of the embedded stresses in the AlN/GaN superlattices is carried out. The interconnection of the porosity in gold nanostructures with their plasmonic properties was established. It was established that the structural, optical and electrophysical properties of multilayer structures and SL are determined by the mechanism of stress relaxation.

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Files

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