Solodkyi M. Multi-beam spectra of X-ray and electron scattering in complex crystalline compounds

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0421U102306

Thesis Registration Form

0421U102306.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

07-05-2021

Specialized Academic Board

Д 76.051.01

Yuriy Fedkovych Chernivtsi National University

Essay

The dissertation is devoted to the investigation of structural inhomogeneities of semiconductor heterostructures, multi-layerd systems, single crystals and polycrystals by the methods of multi-beam X-ray diffractometry and electron backscatter diffraction. Approaches for determining deformation profiles by the analysis of multi-beam X-ray (φ-scans) and electron (Kikuchi patterns) diffraction patterns are proposed. The relationship between changes in multi-beam spectra and structural features of crystals of different origins has been established.

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autoreferat-Автореферат-Солодкого М.С..pdf

ДИСЕР-СОЛОДКИЙ.pdf

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