Vasyl'tsov I. Elaboration of the mathematical models and software for evaluation of digital devices functional reliability parameters.

Mathematical models of the reliability parameters evaluation are the object of investigation. The disertation aim is the elaboration of mathematical models and software intended for implementation of procedures of an automation evaluation and a support of the functional reliability parameters evaluation of the microelectronic digital devices. The methods and mathematical means of the theories of probabilities, sets, graphs, digital automatons, algebra of logic, methods of the systems analysis are used. The calculational approach has been advanced, the failure model of logic gate has been constructed, the subsystem of the reliability design has been developed. The methods, model and software are introduced. The field of use - microelectronics engineering plants, research institutes, educational institutes and universities.