Nizkova A. Dynamical Effects in the Integrated X-Ray Diffractometry of the Imperfect Crystals

Українська версія

Thesis for the degree of Doctor of Science (DSc)

State registration number

0504U000618

Thesis Registration Form

0504U000618.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

16-11-2004

Specialized Academic Board

Д26.168.02

Essay

The theoretically predicted phenomena of multiplicity of the X-ray diffuse scattering, which have the unique sensitivity to defects, are proved experimentally: the variation of the total (sum of bragg and diffuse) integrated reflective power (TIRP) due to the distortions' increase and the dependence of a selectivity of the TIRP sensitivity to defects of different kinds with variation of the diffraction conditions. The based on these phenomena methods are developed, which provide the quantitative diagnostics of several kinds of defects in crystals.

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Files

aref.doc

dis1.doc

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