Borcha M. Multi-beam spectra of X-ray and electron scattering in real crystals, multi-layred and nano-scaled systems

Українська версія

Thesis for the degree of Doctor of Science (DSc)

State registration number

0514U000156

Thesis Registration Form

0514U000156.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

29-11-2013

Specialized Academic Board

Д 76.051.01

Essay

On the basis of features of two- and multi-beam X-ray diffraction the theoretical and experimental methods were developed for precision determination of lattice parameters and its changes due to crystal strains and temperature variation. Mechanisms and regularities of forming of multi-beam X-ray intensity profiles on Kossel patterns, X-ray diffraction patterns of Renninger scans, and Kikuchi patterns (electron diffraction) were establish. Enhanced algorithms and soft-ware were developed. The technique for calculating and graphic presenting multi-beam patterns of Renninger scan in crystals were developed for multi-layered systems with the strain gradient on thickness

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