Lizunov V. Phase variational intensification of structure imperfection display in a scattering pattern

Українська версія

Thesis for the degree of Doctor of Science (DSc)

State registration number

0516U000695

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

06-09-2016

Specialized Academic Board

Д 26.168.02

G. V. Kurdyumov IMPh of the N.A.S.U.

Essay

The conditional on phase phenomenon of interrelated dispersion and phase variational intensification to 4-6 orders sensitivity magnitude, as well as improvement of informative possibilities of structural diagnostics have been discovered. It has been shown that increasing of sensitivity and informativity of dynamical scattering pattern in comparison with kinematical one is caused by change of mechanism of defect impact on these patterns. In the case of kinematical pattern defects impact on amplitude of wave function only. At the same time in the case of dynamical pattern, defects affect additionally on wave vector's modules (i.e. on its phase) that is exponentially more efficiently. Then, it provides possibility phase variational increasing of diagnostics informativity. The additional phase mechanism of significant defect's influence, which is conditioned on nonlinear effects of multiple scattering on the fluctuating crystal part describing extinction due to scattering on defects for both Bragg and diffuse waves, has been considered. In addition, it has been established that discovered phase sensitive to structure mechanisms of defect influence on the scattering pattern cause intensified on orders of magnitude dependences of the pattern and sensitive to the structure parameters on defect characteristics as well as diffraction conditions. It has been shown that character of defect influence on the scattering pattern (magnitude and sign, i.e. increasing and decreasing of brilliance) is determined by results of competitive effect of different dispersive effects. As a result detection of sensitive to phase mechanisms provided new possibility using established sensitivity to defect characteristics for total integral intensity of dynamical diffraction and its sensitive to structure dependences on diffraction conditions for structure diagnostics as the most sensitive, informative, fast and easy method.

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