Mel'nyk V. X-ray diffraction investigation of structural perfection changes of the dislocation-free silicon crystals under the influence of ion radiation, annealing and hydrostatic pressure.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0400U001684

Thesis Registration Form

0400U001684.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

16-06-2000

Specialized Academic Board

К 26.199.01

Essay

This thesis is devoted to the experimental investigation of regularities of the dynamical X-ray Bragg diffraction on crystals, containing various structural distortions under different physical factors influence. With the help of X-ray diffractometricalinvestigations it was proved that hydrostatic pressure leads to substantial lowering of structural perfection in silicon crystals.

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