Bojchuk V. Multidimensional method and algorithms of test generation for combined diagnosing of microprocessor devices.

The dissertation is devoted to development of test combined diagnosing of modern microprocessor devices. A new structrural-behavioural model of modern microprocessor devices is combination of structural and behavioral submodels, which connected by fuzzy relation. A new approach to test generation, based on parallel propagation algorithm and decision of undeterminаted (diophantine) equations, is propoused. Ways of conflicts prevention, which arise in test generation process, were developed. Technique of test quantity minimization is elaborated, which is based on fuzzy relation. Main rezults of this work were used in the subsystem of test generation. Creation of this subsystem has allowed to simplyfy structure and expand functional opportunities of test combined diagnosing systems software. This increases reliability of fault search and efficiency of test combined diagnosing process.