Politans'kyj R. Structural and optical properties of multicompound thin films modified by active types of treatment

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0401U003154

Thesis Registration Form

0401U003154.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

26-10-2001

Specialized Academic Board

Д 76.051.01

Essay

An amorphous layer have been detected near the "layer-substrate" interface in SiGe epi-layers by means of high-resolution x-ray diffractometry and mathematical modellingf (for films, prepared by CVD). It should be mentioned that the lazer treatment give a possibility to realize an stimulated in some direction (which depend on the lazer beam direction) improovment of structural properties of CdHgSe films. Key words: SiGe epi-layers, CdHgSe thin films, ion implantation, lazer sputtering, high-resolution x-ray diffractometry, raman spectroscopy.

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