Ruvinsky B. The influence of technological factors on defective subsystem and electronic processes in lead chalcogenide PbTe, PbSe and PbS films

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0403U000881

Thesis Registration Form

0403U000881.pdf

Applicant for

Specialization

  • 01.04.18 - Фізика і хімія поверхні

07-03-2003

Specialized Academic Board

К 20.051.03

Essay

In the theses influence's mechanisms of technological factors on defect formation and electronic processes in lead chalcogenide PbTe, PbSe and PbS films during film's growing by hot-wall method, at the interaction with oxygen of residual atmosphere and under film's thermal annealing in vacuum were investigated.

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Files

aref.doc

dis.doc

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