Mihajlov S. Improving of X-ray fluoroscopy systems parameters based on non-destructive testing of electron-beam device

The work is devoted to improving of X-ray fluoroscopy systems parameters based on non-destructive testing, such as relative control sensitivity and range of inspected thicknesses of objects, by using the mode of adjustable duration of accumulation of signals on the target for transmitting electron-beam device. The simulation technique for the shadow x-ray image of inspected object has been proposed. The mathematical models of signals transformation in transmitting x-ray and optical electron-beam devices are developed. The relations for the relative control sensitivity, for signal-to-noise ratios and for resolving powers of systems from duration of accumulation, parameters of a X-radiation, parameters and operation mode of electron-beam devices are defined. Experimental researches for X-ray fluoroscopy systems in a mode of adjustable duration of signals accumulation with various X-ray sources are carried out