Kritsun I. Multiwave X-ray Diffractometry of Real Crystals

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0405U004997

Thesis Registration Form

0405U004997.pdf

Applicant for

Specialization

  • 01.04.07 - Фізика твердого тіла

28-10-2005

Specialized Academic Board

Д 76.051.01

Essay

The dissertation focuses on the further development of non-deforming methods for the investigation of structural perfection of real crystals by means of multiwave X-ray diffractometry. The method of determining absolute values of lattice periods of crystals with the help multiwave diffractometry hes been suggested.

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Files

Disser-Krizyn.doc

aref.doc

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