Tayanov V. Recognition systems modeling by reliability indexes for small test samples

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0407U001251

Thesis Registration Form

0407U001251.pdf

Applicant for

Specialization

  • 01.05.02 - Математичне моделювання та обчислювальні методи

01-03-2007

Specialized Academic Board

Д 35.052.05

Lviv Polytechnic National University

Essay

The dissertation is devoted to development of the recognition system model as reliability parametrical function when sample size is small. Basing on developed coefficients one can provide fast, multifaceted, effective analysis and synthesis of the recognition system in small sample size conditions as result of the recognition system optimization model parameters procedure. Such analysis and synthesis one can not realize using classical approaches only. Effectiveness of proposed approaches have been confirmed by results of numerical modeling.

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Files

aref.doc

dysert_doc--01Tytul.doc

dysert_doc--02Zmist.doc

dysert_doc--03Spysok.doc

dysert_doc--04Vstup.doc

dysert_doc--05Rozdil1.doc

dysert_doc--06Rozdil2.doc

dysert_doc--07Rozdil3.doc

dysert_doc--08Rozdil4.doc

dysert_doc--09Literatura.doc

dysert_doc--10Dodatky.doc

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