Mudar A. Methods and means of improving the efficiency of test diagnosing of storage devices.

Research object: process of the test diagnosing of microcircuits and modules of memory. Research purpose: development of methods and facilities of choice of the optimized set of tests. Article of research: methods and facilities which promote efficiency of the test diagnosing of storages of data. Research methods: Automation of synthesis of micro operations is in the algorithms of tests. For the choice of the optimized sequence of tests the theory of unclear plurals and algorithms of unclear conclusion is applied. Theoretical and practical results: the tasks of the test diagnosing are formulated; the algorithm of "bubble" of sorting of array of data is modified; the UY- circuit of algorithms and program of tests of march FD are developed, march A; the program Optimal_test is developed in language of C++. Novelty: the method of average estimations of diagnostic properties of tests is first developed; the mathematical model of machine of Turing is improved; the operator model of disrepairs of microcircuits of memory found subsequent development; the receptions of program of tests development are improved by the language of Prove. Degree of introduction: "Diava" ChSTU.