Chekrygina I. Magneto-structural analysis of nanostructured film systems based on 3d-metal

The magnetic-structural analysis was carried out to establish the features of magnetic properties of multilayer and composite nanosystems consisting of metal alloy, insulators and semiconductors with different inner structure. For [CoFeZr(tm)/Si(tSi)]n multilayers the influence of size effect on the film magnetization caused by Si interlayer thickness changing has been revealed. Using complex study of magnetic measurements and computer modeling of small-angle X-Ray diffraction (SAXRD) spectra it was confirmed that intermixing reactions took place at the layer interfaces. During sputtering, the formation of 2 nm thick nonmagnetic silicide zone occurred for these systems. For [(Co45Fe45Zr10)46(Al2O3)54/Si]n composite multilayers it was experimentally established that magnetic state essentially changes (superferromagnetic - superferromagnetic - ferromagnetic state) when silicon interlayer thickness increases. It was shown that SiC interlayer using prevents intermixing reactions at interfaces in contrast to systems containing interlayers of amorphous silicon. The technique of evaluation of granule volume concentration based on SAXRD and magnetic measurements for non-intermixing composite multilayers has been developed. For composite nanosystems consisting of non-interactive magnetic particles the method of evaluation of granule geometric parameters using ferromagnetic resonance data is offered and approved.