Buchkovska M. Metallic nature of conductivity in the post percolation thicknesses range of ultrathin metallic films with cubic crystal lattice.

Results of researches published in 20 scientific works are presented for the thesis defense purpose. The dissertation is devoted to investigation of structure and electrical properties of ultrathin Cu, Au, Mn and Pd films condensed under high vacuum conditions at residual gas pressure less than 10-7 Pa. The metal films were deposited on top of a dielectric substrate at 78 K. The deposition was performed under the conditions of "quench condensed" regime (Тп < 0,1 T - metal melting temperature). Polycrystalline metal layers were successfully obtained by applying the "quench condensed" approach of metal film coating. Linear dimensions of the metal films crystallites were controlled by pre-deposited substrate layer of nanometer thickness Sb, Ge or Si surfactant. It was shown that surfactant substrates could significantly reduce the metal film thickness corresponding to the percolation threshold. It enabled us to produce electrically continuous metallic film with minimal thickness (5-6 nm for Au, Cu and 3-4 nm for Mn and Pd). Size dependence of kinetic coefficients of the studied metal films was explained within the framework of quasi-classical, internal and quantum size effect theories. It was conducted a comparative analysis of different theories from the point of view of their suitability for quantitative description of the charge transport phenomena in metallic films in different thickness regions.