Chekhmestruk R. Methods and devices for measuring parameters of radio frequency (RF) immitance logic gates

Research object - the process of measuring immittance and works parameters immittance logic gates (ILG). The aim - increase the accuracy and reduce the complexity of measuring admittance and works parameters of RF ILG. Methods: basic provisions theory of complex variable functions, theory of electronic circuits analysis, mathematical analysis, theory of errors, the theory of conformal mappings and matrix methods, numerical methods of solving equations, methods of physical and computer modeling. Theoretical results: the first time developed a method for measuring the invariant coefficient stability of RF ILG; first developed the graphical-analytical method for measuring invariant coefficient stability of RF ILG; further developed a method of "floating" loads; further developed a method for measuring the dynamic range of ILG; improved method of impedance measurement. Practical value: a new kind elements of measuring devices - immittance limiters; developed a set of radio-frequency devices, which convert video pulse signals into immitance and vice versa, and the device which indicate immitance nature; analyzes the methodological errors of the developed methods measuring the parameters of a non-standard system admittance ILG; first proposed method for measuring parameters of RF ILG; developed a computer program to calculate the admittance parameters of RF ILE. Degree of implementation: the work implemented in the LLC-Company "RADIO" for metrological evaluation dynamic range and the invariant coefficient stability of immitance logic gates in the UHF frequency range. Sector (industry) use - electronics.