Pavlova S. Investigation of filamentation and nonlinear optical phenomena in semiconductor materials of the telecommunication wavelength range.

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0421U100257

Applicant for

Specialization

  • 01.04.05 - Оптика, лазерна фізика

04-02-2021

Specialized Academic Board

Д 26.159.01

Institute of Physics of National Academy of Sciences of Ukraine

Essay

The dissertation is devoted to the study of physical phenomena and processes induced by femtosecond laser pulses with the central wavelength of 1550 nm in semiconductor materials (c-Si, InP, As2S3) and in chalcohalide glass 65GeS2-25Ga2S3-10CsCl at a wavelength of 800 nm. For this research, an Er-Yb-doped fiber laser with a wavelength of 1.55 µm was developed. The femtosecond laser source delivers a maximal value of the pulse energy of 2 µJ at a pulse duration of 410 fs and repetition rate of 250 kHz. Using a time-resolved pump-probe technique, non-destructively interact radiation with the crystals at wavelength 1550 nm was shown. The spectral changes of pulses during the interaction with c-Si, As2S3, InP were observed for the first time. Those are an asymmetric expansion of the spectrum of the output pulse from 25 nm to 100 nm with a shift to the short-wavelength region in c-Si, symmetrical expansion spectrum in As2S3 from 25 nm to 300 nm, and slight changes in the spectrum of InP, and also third-harmonic generation in c-Si and As2S3. Non-linear spatial-temporal transformation of the fs pulse, which results in the transformation of the angular profile of the beam from Gaussian to Bessel in c-Si and multifilamentation in As2S3 and generation of green third harmonic, was observed. The dependence of the angular distribution of radiation at a wavelength of 1.55 µm and its third harmonic in c-Si was investigated. Also, an increase in the duration of fs of laser pulses has been registered in c-Si. The physical mechanisms of their formation have been proposed, namely: two-photon absorption processes, Kerr self-focusing, refraction, and solid-state plasma absorption. All these processes are the cause of complex pulse conversion. The advent of ultrafast infrared lasers provides a unique opportunity for the direct fabrication of three-dimensional microdevices. However, strong nonlinearities prevent access to modification regimes in narrow gap materials with the shortest laser pulses. In our study, by a judicious choice of the writing parameters, including laser pulse energy, repetition rate, and inscription speed, the optical structures inside c-Si by the femtosecond laser at a wavelength of 1.55 um were recorded. In the study, it was found that there exists a threshold of the pulse energy to produce a high-quality groove, which is 0.65–2 µJ. It was shown that optimal writing velocity is in the range 0.01–0.07 mm/s at a repetition rate of 0.25–1 MHz. Using femtosecond pulses at wavelength 1.55 um, the structures in As2S3, near-surface modifications in InP have been demonstrated. Focused laser pulses have induced the refractive index modification inside the 65GeS2-25Ga2S3-10CsCl glass at 800 nm wavelength. It was revealed that the main contributions that prevent modification with the shortest pulses are beam depletion by multiphoton absorption, Kerr-induced phase distortions, and defocusing of strong plasma in c-Si and InP.

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