Cheshun V. Optimization of sequences the test-vector during the testing combined diagnosing of digital microprocessor devices

Sequences of test-vectors for digital microprocessor devices test combined diagnosis. Efficiency and authentic growth of test combined diagnosis process. The research methods and equipment - computer simulation, experimental research using system of diagnosis. Novelty - take into account dynamic faults. Theoretical and practical results are methods and algorithms of optimization of sequences of test-vectors, manner of hardware implementation of condition algorithms of diagnosis. Degree of introduction - instrumental equipment of diagnosis (there are acts of introduction). A branch of application - digital devices system of test diagnosis.