Len E. Bases of the dynamical multiparametric diffractometry of single crystals with defects

The phenomenon of unique structural sensitivity of multiple scattering pattern dependencies on the diffraction conditions in crystals with defects has been discovered. The nature of this phenomenon is related to the appearance of relationship between dependencies of dynamical scattering pattern on defect's characteristics and diffraction conditions due to nonlinear effects of the mutual influence of multiple scattering processes on periodic and fluctuating parts of the crystal potential. The generalized theoretical models of dynamical scattering of radiation in crystals with defects of arbitrary size for various diffraction conditions and measurement techniques have been developed. The mechanisms determining the discovered phenomenon and providing a radical (by several orders of magnitude) increase in sensitivity of dynamical scattering pattern (compared with kinematical one) to the characteristics of defects have been established and quantitatively described. The fundamentally new quantitative methods for dynamical multiparametric diffractometry of several types of defects in single crystals have been developed and approved. These methods are based on a joint data processing of diffraction experiments, obtained under different dynamical diffraction conditions and various experimental methods, and provide an increase both sensitivity, uniqueness and informativeness of combined diagnostics of complex defect structures in single-crystal products of modern technology.