Danyk A. Physical bases for scattered radiation correction in X-ray imaging.

Українська версія

Thesis for the degree of Doctor of Philosophy (PhD)

State registration number

0822U100360

Thesis Registration Form

0822U100360.pdf

Applicant for

Specialization

  • 105 - Прикладна фізика та наноматеріали

29-12-2021

Specialized Academic Board

ДФ 26.001.239

Taras Shevchenko National University of Kyiv

Essay

The present work is devoted to the development of an algorithmic scattering correction method for improving the quality of X-ray images obtained using existing hardware solutions without the need to increase the patient absorbed dose.

Read more

Files

autoreferat-Даник_PhD_анотація.pdf

dis_Даник А.pdf

Similar theses

0824U001079

Stanislav Shevchenko

Structural and morphological characteristics and electrophysical properties of porous condensates of Zn, Ni, Cu and their oxides in a combination of C and Si

0824U000997

Izhyk Oleh

Development of methods for synthesis of nanosized polymer and polymer-inorganic brushes with special electrophysical and optical properties

0824U000630

Vadym Plakhtii

Ultrawideband Electromagnetic Fields in Problems of Subsurface Recognition Objects by Artificial Neural Networks

0824U000539

Yiyang Luo

Sparse Antenna Array Design Based on Special Matrix Operations

0824U000538

Denys Horokh

Regularities of formation, structural features and properties of ion-plasma nitride coatings TiSiN/NbN and TiSiN/CrN