Reshetnyak M. Strategy Development of full-profile analysis of spectrums x-ray fluorescence

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0401U002216

Thesis Registration Form

0401U002216.pdf

Applicant for

Specialization

  • 01.04.01 - Фізика приладів, елементів і систем

26-06-2001

Specialized Academic Board

К 55.051.02

Essay

Thesis is devoted to strategy development of full-profile. X-ray fluorescent analysis for searching spectral Chemical element lines and determination of their Parameters. In the work, mathematical correctness of Spectrum dissolution functions by the unchangeable Basis was proved. Adequate description of analytical line Form was found. A quantitative criterion of discovery Limit for superimposing lines was determined. Algorithm Of full-profile analysis of X-ray fluorescence spectra Was developed. The main results of the work were Applied for development of native analytical software complex "SPRUT" for X-ray fluorescent analysis

Read more

Similar theses

0421U103746

Shutylieva Olha V.

The phase composition, magnetoresistive and magnetic properties of devices structures based on Ni and Co and Dy or Bi

0421U103438

Opolonin Oleksandr D.

Principles of characterization of materials by effective atomic number in radiographic control

0521U101782

Tsybrii Zinoviya F

Physical and technological grounds of IR and THz HgCdTe-detectors and IR blocking elements development

0521U101665

Humeniuk-Sychevska Zhanna V.

Optoelectronic properties of low-dimensional structures based on narrow-gap semiconductors in the IR and THz spectral ranges

0421U102655

Yehorov Vadym A.

Improving metrological and operational characteristics of elements and systems of atomic emission spectral analysis