Yehorov V. Improving metrological and operational characteristics of elements and systems of atomic emission spectral analysis

Object of research: the process of atomic emission analysis of the elemental composition of matter and ways to increase its hardware and analytical accuracy. Purpose: to identify the physical patterns of excitation processes of analysis and registration of emission optical spectra and use these patterns to expand the excitation modes of plasma formations, as well as the resolution and dynamic range of multichannel photodetectors. Methods: mathematical modeling and calculations of spectrum generation processes, optical systems and spectral data recording systems and experimental methods of verification of theoretically obtained regularities. Theoretical and practical results, scientific novelty: methods of increase of resolution and dynamic range of systems of registration and data processing of data of spectral measurements, methods of control of temperature of multielement photodetectors without of additional temperature sensors are developed. Practical significance: the proposed techniques can be used to improve the equipment of emission spectrometry. Scope: devices of atomic emission spectral analysis and in adjacent areas of optical spectrometry, remote sensing, obtaining images in the infrared and radio range.