Taran Y. Mathematical model and mechanism of effect of pulse electromagnetic fields on microstructures

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0401U002372

Applicant for

Specialization

  • 01.04.03 - Радіофізика

20-06-2001

Specialized Academic Board

Д 64.052.03

Kharkiv National University Of Radio Electronics

Essay

The thesis is dedicated to research of processes in inhomogeneous metal-dielectric microstructures arranged in a chip of integrated circuits, at effect of pulse electromagnetic fields. At construction of mathematical model and detection of the mechanism of effect of pulse electromagnetic fields on microstructures the radiophysical approach to a problem of effect of pulse electromagnetic fields on integrated circuits was used. The experimental researches have allowed to reveal functionly significant microstructural elements at effect of pulse electromagnetic fields on integrated circuits in the waveguide. Influencing the polarization factor on a developmental character of degradation processes in thin metallical films is established. The distributions of electromagnetic fields near to integrated circuits are obtained. The reasons, character and dynamics of development of local degradation processes in metallical films are detected at effect of pulse electromagnetic fields.

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