Sysenko I. Deductive-Parallel Fault Simulation on Reconfigurable Models of Digital Systems

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0402U003517

Applicant for

Specialization

  • 05.13.13 - Обчислювальні машини, системи та мережі

30-10-2002

Specialized Academic Board

Д 64.052.01

Kharkiv National University Of Radio Electronics

Essay

The thesis is devoted to the development of the fast stuck-at-fault simulation methods on the reconfigurable models of digital systems, oriented on its implementation in programmable logic with purpose of synthesized test quality evaluation. The model of deductive-parallel fault analysis, combines deductive fault simulation processibility and processing speed of parallel vector was modified; deductive model of data structure reconfiguration, which allows processing of the set of faults in one iteration with purpose of applied input sequences evaluation speed-up was proposed; the deductive-parallel fault simulation method for digital devices, represented on gate level and register transfer level in form of Boolean equations was developed; the backtraced fault simulation method of VLSI circuits with using of deductive-parallel procedures for reconvergent fan-outs evaluation and backtracing for tree-type structures was improved

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