Karkulovska M. Development of Fabry-Perot interferogram treatment method for plane parallel film structure parameters

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0405U000999

Applicant for

Specialization

  • 01.04.18 - Фізика і хімія поверхні

28-02-2005

Specialized Academic Board

Д 20.051.06

Kolomyia Educational-Scientific Institute The Vasyl Stefanyk Precarpathian National University

Essay

Object. The theoretical and computer amplitude-phase simulation of Fabry-Perot interference spectra properties. Purpose. Amplitude and phase spectroscopy of light reflected and transmitted by monolayer plane parallel film structure. Methods. The mathematical analysis and computer simulation in MathCAD of plane electromagnetic wave optical heterogeneity in spatial one-dimensional model. Results. For the first time the physical conditions when the wave phase of light reflected and transmitted by the monolayer plane parallel film structure expressed by energetic reflection and transmission coefficients is grounded. For the first time the new physical approach for determination of Fabry-Perot interferogram instrumental characteristics is proposed and grounded. For the first time the method of film structure optical parameters estimation via the determination of square limited by the contour of interference band. Application. The received results can be used for nondestructive method of parameter control surface industrial in plating processing.

Files

Similar theses