Slobodyan N. Simulation of defectoscopic X-ray television systems for non-destructive testing of semiconductor materials

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0407U003548

Thesis Registration Form

0407U003548.pdf

Applicant for

Specialization

  • 05.27.01 - Твердотільна електроніка

12-09-2007

Specialized Academic Board

Д 26.002.08

Publishing and Printing Institute of Igor Sikorsky Kyiv Polytechnic Institute

Essay

The work is devoted to increasing effectiveness of X-ray television systems for non-destructive testing on base of selecting by simulation the most profitable regimes of X-ray-electric converter for testing of the semiconductor materials. The simulation of radiation generation from pulse X-ray tubes is performed. The digital linear and non-linear models of X-ray-electric unit with X-ray vidicon are implemented. The end-to-end model of converter with CCD-matrix is developed.

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