Lebedynskiy O. CsI(Tl) films: structure, scintillation properties, imaging

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0408U005680

Applicant for

Specialization

  • 01.04.10 - Фізика напівпровідників і діелектриків

26-11-2008

Specialized Academic Board

Д 64.169.01

Institute for single crystals NASU

Essay

The columnar layers of dielectric scintillator CsI(Tl) with reproductible morphology, structural and scintillation characteristics were obtained by vacuum deposition onto different types of substrate. The physical processes of morphology creation and crystalline structure formation were ascertained by means of X-ray diffraction analysis and scanning electron microscopy methods . The correlation of structure characteristics with scintillation properties were estimated for columnar films of dielectric scintillator CsI(Tl). Imaging possibility of CsI(Tl) columnar layers under gamma - radiation was demonstrated. The estimation of CsI(Tl) layers spatial resolution was carried out by means of modulation transfer function building.

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