Kramchenkov A. High-resolution elastic scattering spectrometry of ion beams

The thesis is devoted to analysis of factors influencing on the maximum resolution of elastic scattering techniques. It is shown, that resolution is increased in 10 times (from 15-30 keV to 1,5-3 keV at 1 MeV primary ion energy) at the expense of using of an electrostatic spectrometer instead of a standard semiconductor detector and by means of decreasing of the energy spread of the ion beam . During the research a new elastic scattering end-station as a part of IAP NAS of Ukraine accelerator-based facility was constructed. The end-station is equipped with a precision electrostatic spectrometer with relative energy resolution of 3·10-4. A possibility of Rutherford backscattering spectrometry application to investigation of surfaces of metal melts was demonstrated. It was experimentally shown, that at scattering angle of 38° contribution of the sample surface roughness to the technique resolution is less than 1,8 keV. By means of ion optics optimization ion current density was increased in 60 times and it allowed us to restrict accelerator stabilization slit and, hence, to decrease energy spread of the ion beam to 0,9 keV at 1 MV accelerator voltage. At the novel elastic scattering end-station stoichiometric ratio in the sample of pressed titanium sponge was measured. It is shown, that ratio of titanium to hydrogen atoms amount is less than two.