Mazurok N. The Physical-statistical method of determining of reliability of solid state electronics devices

Thesis for the degree of Ph.D. by specialty 05.27.01 - solid state electronics. - National technical University of Ukraine "Kiev Polytechnic Institute", Kiev, 2013. The thesis is devoted to the development of the physical-statistical method of determining of the reliability of solid-state electronics devices with a diffusion mechanism of degradation for the short-term assessment in contrast to the statistical method of assessment of the criterical physical characteristics of their material without a long, voluminous and costly testing. The physical model of the reliability of devices with using of the criterical physical characteristics of their material is developed. It is first proposed to differentiate devices into homogeneous, relatively heterogeneous and heterogeneous sets according to the presence or absence of their statistical dispersion. For these sets normal and log-normal physical-statistical models of reliability a based and tested on a model material with a diffusion mechanism of degradation. Methods of rapid determination of diffusion parameters a proposed and patented as inventions. Keywords: physical-statistical model of reliability, solid-state electronics devices, diffusion mechanism of degradation, criterical physical characteristics, homogeneous and heterogeneous sets.